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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Description
(Communications in Computer and Information Science) 1st ed. 2019 Edition
by Anirban Sengupta (Editor), Sudeb Dasgupta (Editor), Virendra Singh (Editor), Rohit Sharma (Editor), Santosh Kumar Vishvakarma (Editor)
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.
The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
Details
Year:
2019
Pages:
782
Language:
English
Format:
PDF
Size:
110 MB
ISBN-10:
9813297662
ISBN-13:
978-9813297661
ASIN:
B07WQKPF5L
